Binji Cheng: search on Z-Library

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1

Impact of Self-Heating on the Statistical Variability in Bulk and SOI FinFETs

Wang, Liping, Brown, Andrew R., Nedjalkov, Mihail, Alexander, Craig, Cheng, Binjie, Millar, Campbell, Asenov, Asen

Journal:

IEEE Transactions on Electron Devices

Year:

2015

Language:

english

File:

PDF, 6.31 MB

english, 2015

2

[IEEE 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Glasgow, United Kingdom (2013.09.3-2013.09.5)] 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Circuit-level modeling of FinFet sub-threshold slope and DIBL mismatch beyond 22nm

Royer, Pablo, Zuber, Paul, Cheng, Binjie, Asenov, Asen, Lopez-Vallejo, Marisa

Year:

2013

Language:

english

File:

PDF, 1.07 MB

english, 2013

3

Hierarchical Simulation of Statistical Variability: From 3-D MC With “ ab initio” Ionized Impurity Scattering to Statistical Compact Models

Kovac, U., Alexander, C., Roy, G., Riddet, C., Binjie Cheng, Asenov, A.

Journal:

IEEE Transactions on Electron Devices

Year:

2010

Language:

english

File:

PDF, 963 KB

english, 2010

4

[IEEE 2009 IEEE International Symposium on Circuits and Systems - ISCAS 2009 - Taipei, Taiwan (2009.05.24-2009.05.27)] 2009 IEEE International Symposium on Circuits and Systems - Impact of random dopant induced statistical variability on inverter switching trajectories and timing variability

Kamsani, Noor Ain, Cheng, Binjie, Roy, Scott, Asenov, Asen

Year:

2009

Language:

english

File:

PDF, 1009 KB

english, 2009

5

Impact of NBTI/PBTI on SRAM Stability Degradation

Cheng, Binjie, Brown, Andrew R., Asenov, Asen

Journal:

IEEE Electron Device Letters

Year:

2011

Language:

english

File:

PDF, 539 KB

english, 2011

6

[IEEE 2011 IEEE International Symposium on Circuits and Systems (ISCAS) - Rio de Janeiro, Brazil (2011.05.15-2011.05.18)] 2011 IEEE International Symposium of Circuits and Systems (ISCAS) - An analytical mismatch model of nano-CMOS device under impact of intrinsic device variability

Hong, Feng, Cheng, Binjie, Roy, Scott, Cumming, David

Year:

2011

Language:

english

File:

PDF, 1.90 MB

english, 2011

7

Drain bias effects on statistical variability and reliability and related subthreshold variability in 20-nm bulk planar MOSFETs

Wang, Xingsheng, Brown, Andrew R., Cheng, Binjie, Roy, Scott, Asenov, Asen

Journal:

Solid-State Electronics

Year:

2014

Language:

english

File:

PDF, 2.10 MB

english, 2014

8

Comprehensive study of the statistical variability in a 22nm fully depleted ultra-thin-body SOI MOSFET

Mohd Zain, Anis Suhaila, Markov, Stanislav, Cheng, Binjie, Asenov, Asen

Journal:

Solid-State Electronics

Year:

2013

Language:

english

File:

PDF, 1.06 MB

english, 2013

9

[IEEE 2010 IEEE International Symposium on Circuits and Systems - ISCAS 2010 - Paris, France (2010.05.30-2010.06.2)] Proceedings of 2010 IEEE International Symposium on Circuits and Systems - Statistical NBTI-effect prediction for ULSI circuits

Tang, Tong Boon, Murray, Alan F., Cheng, Binjie, Asenov, Asen

Year:

2010

Language:

english

File:

PDF, 587 KB

english, 2010

10

[IEEE 2012 IEEE International SOI Conference - Napa, CA, USA (2012.10.1-2012.10.4)] 2012 IEEE International SOI Conference (SOI) - Statistical variability in scaled generations of n-channel UTB-FD-SOI MOSFETs under the influence of RDF, LER, OTF and MGG

Markov, Stanislav, Zain, Anis Suhaila Mohd, Cheng, Binjie, Asenov, Asen

Year:

2012

Language:

english

File:

PDF, 2.25 MB

english, 2012

11

[IEEE 2012 IEEE International Symposium on Circuits and Systems - ISCAS 2012 - Seoul, Korea (South) (2012.05.20-2012.05.23)] 2012 IEEE International Symposium on Circuits and Systems - A framework to study time-dependent variability in circuits at sub-35nm technology nodes

Tang, Tong Boon, Murray, Alan F., Cheng, Binjie, Asenov, Asen

Year:

2012

Language:

english

File:

PDF, 1.28 MB

english, 2012

12

Statistical Variability and Reliability and the Impact on Corresponding 6T-SRAM Cell Design for a 14-nm Node SOI FinFET Technology

Xingsheng Wang,, Binjie Cheng,, Kuang, Jente B., Nassif, Sani, Brown, Andrew R., Millar, Campbell, Asenov, Asen

Journal:

IEEE Design and Test

Year:

2013

Language:

english

File:

PDF, 3.24 MB

english, 2013

13

A Closed-Tube Detection of Loop-Mediated Isothermal Amplification (LAMP) Products Using a Wax-Sealed Fluorescent Intercalator

Liang, Chao, Cheng, Sijia, Chu, Yanan, Wu, Haiping, Zou, Binjie, Huang, Huan, Xi, Tao, Zhou, Guohua

Journal:

Journal of Nanoscience and Nanotechnology

Year:

2013

Language:

english

File:

PDF, 6.68 MB

english, 2013

14

Statistical Variability in Fully Depleted SOI MOSFETs Due to Random Dopant Fluctuations in the Source and Drain Extensions

Markov, S., Binjie Cheng, Asenov, A.

Journal:

IEEE Electron Device Letters

Year:

2012

Language:

english

File:

PDF, 403 KB

english, 2012

15

[IEEE ESSDERC 2012 - 42nd European Solid State Device Research Conference - Bordeaux, France (2012.09.17-2012.09.21)] 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - Statistical variability in 14-nm node SOI FinFETs and its impact on corresponding 6T-SRAM cell design

Wang, Xingsheng, Cheng, Binjie, Brown, Andrew R., Millar, Campbell, Asenov, Asen

Year:

2012

Language:

english

File:

PDF, 1.43 MB

english, 2012

16

[IEEE ESSDERC 2014 - 44th European Solid State Device Research Conference - Venice Lido, Italy (2014.9.22-2014.9.26)] 2014 44th European Solid State Device Research Conference (ESSDERC) - Accurate simulations of the interplay between process and statistical variability for nanoscale FinFET-based SRAM cell stability

Wang, Xingsheng, Cheng, Binjie, Brown, Andrew R., Millar, Campbell, Asenov, Asen

Year:

2014

Language:

english

File:

PDF, 3.43 MB

english, 2014

17

Arabidopsis ER-localized UBAC2 Proteins Interact with PAMP-INDUCED COILED-COIL to Regulate Pathogen-induced Callose Deposition and Plant Immunity

Wang, Zhe, Li, Xifeng, Wang, Xiaoting, Liu, Nana, Xu, Binjie, Peng, Qi, Guo, Zhifu, Fan, Baofang, Zhu, Cheng, Chen, Zhixiang

Journal:

Year:

2019

Language:

english

File:

PDF, 4.07 MB

english, 2019

18

Observation of multiramp fractional vortex beams and their total vortex strength in free space

Wen, Jisen, Gao, Binjie, Zhu, Guiyuan, Cheng, Yibing, Zhu, Shi-Yao, Wang, Li-Gang

Journal:

Optics & Laser Technology

Year:

2020

File:

PDF, 6.70 MB

2020

19

[IEEE 2012 IEEE Silicon Nanoelectronics Workshop (SNW) - Honolulu, HI, USA (2012.06.10-2012.06.11)] 2012 IEEE Silicon Nanoelectronics Workshop (SNW) - Statistical variability study of a 10nm gate length SOI FinFET device

Cheng, Binjie, Brown, Andrew R., Wang, Xingsheng, Asenov, Asen

Year:

2012

Language:

english

File:

PDF, 1.10 MB

english, 2012

20

Geometry, Temperature, and Body Bias Dependence of Statistical Variability in 20-nm Bulk CMOS Technology: A Comprehensive Simulation Analysis

Wang, Xingsheng, Adamu-Lema, Fikru, Cheng, Binjie, Asenov, Asen

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 2.81 MB

english, 2013

21

[IEEE 2014 20th International Conference on Ion Implantation Technology (IIT) - Portland, OR, USA (2014.6.26-2014.7.4)] 2014 20th International Conference on Ion Implantation Technology (IIT) - Simulation of 3D FinFET doping profiles introduced by ion implantation and the impact on device performance

Wang, Liping, Brown, Andrew, Cheng, Binjie, Asenov, Asen

Year:

2014

Language:

english

File:

PDF, 1.07 MB

english, 2014

22

Optimal DC-Segmentation for Multi-Infeed HVDC Systems Based on Stability Performance

Cheng, Binjie, Xu, Zheng, Xu, Wei

Journal:

IEEE Transactions on Power Systems

Year:

2015

Language:

english

File:

PDF, 1.12 MB

english, 2015

23

[IEEE 2016 Progress in Electromagnetic Research Symposium (PIERS) - Shanghai, China (2016.8.8-2016.8.11)] 2016 Progress in Electromagnetic Research Symposium (PIERS) - Compact broadband printed antenna for mobile phone applications

Cheng Liu,, Hui Liu,, Binjie Wang,, Sailing He,

Year:

2016

Language:

english

File:

PDF, 725 KB

english, 2016

24

[IEEE 2016 IEEE Power and Energy Society General Meeting (PESGM) - Boston, MA, USA (2016.7.17-2016.7.21)] 2016 IEEE Power and Energy Society General Meeting (PESGM) - Optimal DC-segmentation for multi-infeed HVDC systems based on stability performance

Binjie Cheng,, Zheng Xu,, Wei Xu,

Year:

2016

Language:

english

File:

PDF, 658 KB

english, 2016

25

Tetrahydrohyperforin prevents articular cartilage degeneration and affects autophagy in rats with osteoarthritis

Zhang, Jinling, Wang, Sisheng, Rong, Genxiang, Cheng, Fangyue, Gui, Binjie, Shen, Cailiang

Journal:

Experimental and Therapeutic Medicine

Year:

2018

Language:

english

File:

PDF, 1.40 MB

english, 2018

26

Extended Analysis of the $Z^{2}$ -FET: Operation as Capacitorless eDRAM

Navarro, Carlos, Lacord, Joris, Parihar, Mukta Singh, Adamu-Lema, Fikru, Duan, Meng, Rodriguez, Noel, Cheng, Binjie, El Dirani, Hassan, Barbe, Jean-Charles, Fonteneau, Pascal, Bawedin, Maryline, Milla

Journal:

IEEE Transactions on Electron Devices

Year:

2017

Language:

english

File:

PDF, 1.80 MB

english, 2017

27

Pyrolysis studies on the conversion of vitrinite reflectance and the primary productivity of various non-marine source rocks in China

Guodong Zheng, Yi Duan, Bokuichiro Takano, Binjie Luo, Keming Cheng, Yingjie Zhang

Journal:

Journal of Asian Earth Sciences

Year:

2003

Language:

english

File:

PDF, 430 KB

english, 2003

28

Statistical-Variability Compact-Modeling Strategies for BSIM4 and PSP

Binjie Cheng, Dideban, D., Moezi, N., Millar, C., Roy, G., Xingsheng Wang, Roy, S., Asenov, A.

Journal:

IEEE Design & Test of Computers

Year:

2010

Language:

english

File:

PDF, 878 KB

english, 2010

29

[IEEE 2012 IEEE Silicon Nanoelectronics Workshop (SNW) - Honolulu, HI, USA (2012.06.10-2012.06.11)] 2012 IEEE Silicon Nanoelectronics Workshop (SNW) - Statistical distribution of RTS amplitudes in 20nm SOI FinFETs

Wang, Xingsheng, Brown, Andrew R., Cheng, Binjie, Asenov, Asen

Year:

2012

Language:

english

File:

PDF, 868 KB

english, 2012

30

Accurate Simulation of Transistor-Level Variability for the Purposes of TCAD-Based Device-Technology Cooptimization

Gerrer, Louis, Brown, Andrew R., Millar, Campbell, Hussin, Razaidi, Amoroso, Salvatore Maria, Cheng, Binjie, Reid, Dave, Alexander, Craig, Fried, David, Hargrove, Michael, Greiner, Ken, Asenov, Asen

Journal:

IEEE Transactions on Electron Devices

Year:

2015

Language:

english

File:

PDF, 8.42 MB

english, 2015

31

IMPACT OF INTRINSIC PARAMETER FLUCTUATIONS IN NANO-CMOS DEVICES ON CIRCUITS AND SYSTEMS

ROY, SCOTT, CHENG, BINJIE, ASENOV, ASEN

Journal:

International Journal of High Speed Electronics and Systems

Year:

2007

Language:

english

File:

PDF, 976 KB

english, 2007

32

Benchmarking statistical compact modeling strategies for capturing device intrinsic parameter fluctuations in BSIM4 and PSP

Cheng, Binjie, Dideban, Daryoosh, Moezi, Negin, Millar, Campbell, Roy, Gareth, Wang, Xingsheng, Roy, Scott, Asenov, Asen

Journal:

IEEE Design & Test of Computers

Year:

2011

Language:

english

File:

PDF, 878 KB

english, 2011

33

Properties and microstructures of YBCO superconducting tapes prepared on static and continuously moving silver substrates by a new MOCVD reactor

Yiyuan Xie, Fengchi Yuan, Binji Cheng, Jiping Chen, Guoweng Yang, Bingxin Cui, Xiao-Gang Wang

Journal:

Physica C: Superconductivity

Year:

1994

Language:

english

File:

PDF, 504 KB

english, 1994

34

and

Cheng, Kangqiao, He, Xiaobo, Yang, Haiyang, Zhou, Binjie, Li, Yuke, Luo, Yongkang

Journal:

Physical Review B

Year:

2019

File:

PDF, 1.13 MB

2019

35

[IEEE 2011 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2011.12.5-2011.12.7)] 2011 International Electron Devices Meeting - Statistical variability and reliability in nanoscale FinFETs

Wang, Xingsheng, Brown, Andrew R., Binjie Cheng,, Asenov, Asen

Year:

2011

Language:

english

File:

PDF, 927 KB

english, 2011

36

[IEEE 2011 Design, Automation & Test in Europe - Grenoble (2011.03.14-2011.03.18)] 2011 Design, Automation & Test in Europe - Statistical aspects of NBTI/PBTI and impact on SRAM yield

Asenov, A, Brown, A R, Binjie Cheng,

Year:

2011

Language:

english

File:

PDF, 684 KB

english, 2011

37

[IEEE 2015 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2015.12.7-2015.12.9)] 2015 IEEE International Electron Devices Meeting (IEDM) - Predictive compact modeling of random variations in FinFET technology for 16/14nm node and beyond

Jiang, Xiaobo, Wang, Xingsheng, Wang, Runsheng, Cheng, Binjie, Asenov, Asen, Huang, Ru

Year:

2015

Language:

english

File:

PDF, 1.04 MB

english, 2015

38

Hsa_circ_0005567 Activates Autophagy and Suppresses IL-1Î²-Induced Chondrocyte Apoptosis by Regulating miR-495

Zhang, Jinling, Cheng, Fangyue, Rong, Genxiang, Tang, Zhi, Gui, Binjie

Journal:

Frontiers in Molecular Biosciences

Year:

2020

File:

PDF, 4.63 MB

2020

39

Interplay Between Process-Induced and Statistical Variability in 14-nm CMOS Technology Double-Gate SOI FinFETs

Wang, Xingsheng, Cheng, Binjie, Brown, Andrew Robert, Millar, Campbell, Kuang, Jente B., Nassif, Sani, Asenov, Asen

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 7.00 MB

english, 2013

40

[IEEE 2013 IEEE International Conference on Medical Imaging Physics and Engineering (ICMIPE) - Shenyang, China (2013.10.19-2013.10.20)] 2013 IEEE International Conference on Medical Imaging Physics and Engineering - Nonnegative matrix factorization using target-to-background contrast for fluorescence unmixing

Huang, Shaosen, Zhao, Yong, Hu, Cheng, Qin, Binjie

Year:

2013

Language:

english

File:

PDF, 424 KB

english, 2013

41

Analytical Models for Three-Dimensional Ion Implantation Profiles in FinFETs

Wang, Liping, Brown, Andrew R., Cheng, Binjie, Asenov, Asen

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2013

Language:

english

File:

PDF, 409 KB

english, 2013

42

A Device-level Characterization Approach to Quantify the Impacts of Different Random Variation Sources in FinFET Technology

Jiang, Xiaobo, Guo, Shaofeng, Wang, Runsheng, Wang, Xingsheng, Cheng, Binjie, Asenov, Asen, Huang, Ru

Journal:

IEEE Electron Device Letters

Year:

2016

Language:

english

File:

PDF, 832 KB

english, 2016

43

[IEEE 2014 IEEE 12th International Conference on Solid -State and Integrated Circuit Technology (ICSICT) - Guilin, China (2014.10.28-2014.10.31)] 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Statistical aspects of FinFET based SRAM metrics subject to process and statistical variability

Wang, Xingsheng, Cheng, Binjie, Millar, Campbell, Reid, Dave, Asenov, Asen

Year:

2014

Language:

english

File:

PDF, 1.49 MB

english, 2014

44

New Assessment Methodology Based on Energy–Delay–Yield Cooptimization for Nanoscale CMOS Technology

Jiang, Xiaobo, Wang, Junyao, Wang, Xingsheng, Wang, Runsheng, Cheng, Binjie, Asenov, Asen, Wei, Lan, Huang, Ru

Journal:

IEEE Transactions on Electron Devices

Year:

2015

Language:

english

File:

PDF, 2.79 MB

english, 2015

45

Simulation Study of the Impact of Quantum Confinement on the Electrostatically Driven Performance of n-type Nanowire Transistors

Wang, Yijiao, Al-Ameri, Talib, Wang, Xingsheng, Georgiev, Vihar P., Towie, Ewan, Amoroso, Salvatore Maria, Brown, Andrew R., Cheng, Binjie, Reid, David, Riddet, Craig, Shifren, Lucian, Sinha, Saurabh,

Journal:

IEEE Transactions on Electron Devices

Year:

2015

Language:

english

File:

PDF, 4.87 MB

english, 2015

46

Platelet-rich plasma accelerates skin wound healing by promoting re-epithelialization

Xu, Pengcheng, Wu, Yaguang, Zhou, Lina, Yang, Zengjun, Zhang, Xiaorong, Hu, Xiaohong, Yang, Jiacai, Wang, Mingying, Wang, Binjie, Luo, Gaoxing, He, Weifeng, Cheng, Biao

Journal:

Year:

2020

File:

PDF, 2.86 MB

2020

47

Novel anti-GD2 CAR-T cells exhibit superior cytotoxicity against neuroblastoma

ji, Cheng, You, Fengtao, Zhang, Tingting, Fan, Shuangshuang, Han, Zhichao, Xiang, Shufen, Wang, Yinyan, Sheng, Binjie, Wang, Tian, An, Gangli, Meng, Huimin, Yang, Lin

Journal:

European Journal of Inflammation

Year:

2020

File:

PDF, 1.82 MB

2020

48

[IEEE ESSDERC 2013 - 43rd European Solid State Device Research Conference - Bucharest, Romania (2013.09.16-2013.09.20)] 2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - Impact of statistical variability and charge trapping on 14 nm SOI FinFET SRAM cell stability

Wang, Xingsheng, Cheng, Binjie, Brown, Andrew R., Millar, Campbell, Kuang, Jente B., Nassif, Sani, Asenov, Asen

Year:

2013

Language:

english

File:

PDF, 1.92 MB

english, 2013

49

Multivariate Modeling of Variability Supporting Non-Gaussian and Correlated Parameters

Lange, Andre, Sohrmann, Christoph, Jancke, Roland, Haase, Joachim, Cheng, Binjie, Asenov, Asen, Schlichtmann, Ulf

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2016

Language:

english

File:

PDF, 2.30 MB

english, 2016

50

AIP Conference Proceedings [AIP ION IMPLANTATION TECHNOLOGY 2012: Proceedings of the 19th International Conference on Ion Implantation Technology - Valladolid, Spain (25–29 June 2012)] - Simulation of 3D FinFET doping profiles by ion implantation

Wang, Liping, Brown, Andrew R., Cheng, Binjie, Asenov, Asen

Year:

2012

Language:

english

File:

PDF, 4.89 MB

english, 2012

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